Imaging with Spherically Bent Crystals or Reflectors
Authors: M. Bitter,L.F. Delgado Aparicio, K.W. Hill, S. Scott, A. Ince-Cushman, M. Reinke, Y. Podpaly, J.E. Rice, P.Beiersdorfer and E. Wang
Abstract:
This paper consists of two parts: Part I describes the working principle of a recently developed x-ray imaging crystal spectrometer, where the astigmatism of spherically bent crystals is being used with advantage to record spatially resolved spectra of highly charged ions for Doppler measurements of the ion-temperature and toroidal plasmarotation- velocity profiles in tokamak plasmas. This type of spectrometer was thoroughly tested on NSTX and Alcator C-Mod, and its concept was recently adopted for the design of the ITER crystal spectrometers. Part II describes imaging schemes, where the astigmatism has been eliminated by the use of matched pairs of spherically bent crystals or reflectors. These imaging schemes are applicable over a wide range of the electromagnetic radiation, which includes microwaves, visible light, EUV radiation, and x-rays. Potential applications with EUV radiation and x-rays are the diagnosis of laserproduced plasmas, imaging of biological samples with synchrotron radiation, and lithography.
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Submitted to: Journal of Physics B (Special Issue) (May 2010)
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Download PPPL-4521 (pdf 191 KB 26 pp)
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