Development of a Spatially Resolving X-Ray Crystal Spectrometer (XCS) for Measurement of Ion-Temperature (Ti) and Rotation-Velocity (v) Profiles in ITER
Authors: K. W. Hill, M. Bitter, L. Delgado-Aparicio, D. Johnson, R. Feder, P. Beiersdorfer, J.Dunn, K. Morris, E. Wang, M. Reinke, Y. Podpaly, J. E. Rice, R. Barnsley, M. O'Mullane, and S. G. Lee
Abstract:
Imaging XCS arrays are being developed as a US-ITER activity for Doppler measurement of Ti and v profiles of impurities (W, Kr, Fe) with ~7 cm (a/30) and 10-100 ms resolution in ITER. The imaging XCS, modeled after a PPPL-MIT instrument on Alcator C-Mod, uses a spherically bent crystal and 2d x-ray detectors to achieve high spectral resolving power (E/dE>6000) horizontally and spatial imaging vertically. Two arrays will measure Ti and both poloidal and toroidal rotation velocity profiles. Measurement of many spatial chords permits tomographic inversion for inference of local parameters. The instrument design, predictions of performance, and results from C-Mod will be presented.
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Submitted to: Review of Scientific Instruments (May 2010)
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Download PPPL-4519 (pdf 2.08 MB 5 pp)
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