X-Ray Line-Shape Diagnostics and Novel Stigmatic Imaging Schemes For the National Ignition Facility
Authors: M. Bitter,, K.W. Hill, N.A. Pablant, L.F. Delgado-Aparicio, P. Beiersdorfer, E. Wang, and M. Sanchez del Rio
Abstract:
In response to a recent solicitation from the US Department of Energy we proposed the
development of a new x-ray line-shape diagnostic and novel stigmatic imaging schemes for
the National Ignition Facility (NIF). These diagnostics are based on the imaging properties of
spherically bent crystals, explained in Fig. 1, which have already been successfully applied to
the diagnosis of extended tokamak plasmas for measurements of the ion-temperature and
toroidal flow-velocity profiles [United States Patent: US 6, 259, 763 B1] and refs. [1, 2].
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Presented at: EPS - 38th Conference on Plasma Physics, Strasbourg (June 27 - July 1, 2011)
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Download PPPL-4655 (pdf 2.11 MB 4 pp)
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